Automatic Detection and Imaging of Rivet Hole Defects for Aircraft Structures With Optimized Sensor Array Using Eddy Current Method and Image Analysis

Yuchun Shao; Tian Meng; Kuohai Yu; Zihan Xia; Ruochen Huang; Yang Tao; Ziqi Chen; Jorge Ricardo Salas Avila; Wuliang Yin

doi:10.1109/JSEN.2022.3188863

Automatic Detection and Imaging of Rivet Hole Defects for Aircraft Structures With Optimized Sensor Array Using Eddy Current Method and Image Analysis

Yuchun Shao, Tian Meng, Kuohai Yu, Zihan Xia, Ruochen Huang, Yang Tao, Ziqi Chen, Jorge Ricardo Salas Avila, Wuliang Yin

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	IEEE Sensors Journal
DOIs	https://doi.org/10.1109/JSEN.2022.3188863
Publication status	Published - 1 Mar 2023

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10.1109/JSEN.2022.3188863

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@article{2b6200309e79434e9b1742415dbd954d,

title = "Automatic Detection and Imaging of Rivet Hole Defects for Aircraft Structures With Optimized Sensor Array Using Eddy Current Method and Image Analysis",

author = "Yuchun Shao and Tian Meng and Kuohai Yu and Zihan Xia and Ruochen Huang and Yang Tao and Ziqi Chen and Avila, {Jorge Ricardo Salas} and Wuliang Yin",

year = "2023",

month = mar,

day = "1",

doi = "10.1109/JSEN.2022.3188863",

language = "English",

journal = "IEEE Sensors Journal",

issn = "1530-437X",

publisher = "IEEE",

}

TY - JOUR

T1 - Automatic Detection and Imaging of Rivet Hole Defects for Aircraft Structures With Optimized Sensor Array Using Eddy Current Method and Image Analysis

AU - Shao, Yuchun

AU - Meng, Tian

AU - Yu, Kuohai

AU - Xia, Zihan

AU - Huang, Ruochen

AU - Tao, Yang

AU - Chen, Ziqi

AU - Avila, Jorge Ricardo Salas

AU - Yin, Wuliang

PY - 2023/3/1

Y1 - 2023/3/1

UR - https://doi.org/10.1109/JSEN.2022.3188863

U2 - 10.1109/JSEN.2022.3188863

DO - 10.1109/JSEN.2022.3188863

M3 - Article

SN - 1530-437X

JO - IEEE Sensors Journal

JF - IEEE Sensors Journal

ER -

Automatic Detection and Imaging of Rivet Hole Defects for Aircraft Structures With Optimized Sensor Array Using Eddy Current Method and Image Analysis

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