Original language | English |
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Number of pages | 8 |
Journal | Nanotechnology |
Volume | 25 |
Issue number | 14 |
DOIs | |
Publication status | Published - 11 Apr 2014 |
Calibrated complex impedance and permittivity measurements with scanning microwave microscopy
G. Gramse, M. Kasper, Laura Fumagalli, G Gomila, P Hinterdorfer, F. Kienberger
Research output: Contribution to journal › Article › peer-review