Case study of media noise mechanisms in longitudinal recording

Edward T. Yen; Stella Z. Wu; Thomas Thomson; Roger Ristau; Rajiv Ranjan; Gary C. Rauch; Claus Habermeier; Robert Sinclair

doi:10.1109/20.800967

Case study of media noise mechanisms in longitudinal recording

Edward T. Yen, Stella Z. Wu, Thomas Thomson, Roger Ristau, Rajiv Ranjan, Gary C. Rauch, Claus Habermeier, Robert Sinclair

Research output: Contribution to journal › Article › peer-review

Abstract

A comprehensive study (TEM, MFM, AFM, XRD, Recording Performance and Magnetometry) of media noise mechanisms and their relation to grain structure is reported for model, high noise contrast, CoCrPtTa thin films. The CoCrPtTa media were sputtered on to either CrMn or NiAl/CrMn underlayers causing a change in media noise power of 9dB. The changes in media noise are not related to the topography of the underlayer(s) or due to interaction effects, which the δM technique suggests are negligible in these model samples. A quantitative correlation is obtained between magnetic cluster size and media noise using an analytical first approximation of Zhou and Bertram's micromagnetic model. © 1999 IEEE.

Original language	English
Pages (from-to)	2730-2732
Number of pages	2
Journal	Ieee Transactions on Magnetics
Volume	35
Issue number	5
DOIs	https://doi.org/10.1109/20.800967
Publication status	Published - 1999

Keywords

Longitudinal media
Noise
Underlayer effect

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10.1109/20.800967

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title = "Case study of media noise mechanisms in longitudinal recording",

abstract = "A comprehensive study (TEM, MFM, AFM, XRD, Recording Performance and Magnetometry) of media noise mechanisms and their relation to grain structure is reported for model, high noise contrast, CoCrPtTa thin films. The CoCrPtTa media were sputtered on to either CrMn or NiAl/CrMn underlayers causing a change in media noise power of 9dB. The changes in media noise are not related to the topography of the underlayer(s) or due to interaction effects, which the δM technique suggests are negligible in these model samples. A quantitative correlation is obtained between magnetic cluster size and media noise using an analytical first approximation of Zhou and Bertram's micromagnetic model. {\textcopyright} 1999 IEEE.",

keywords = "Longitudinal media, Noise, Underlayer effect",

author = "Yen, {Edward T.} and Wu, {Stella Z.} and Thomas Thomson and Roger Ristau and Rajiv Ranjan and Rauch, {Gary C.} and Claus Habermeier and Robert Sinclair",

note = "Yen, ET Wu, SZ Thomson, T Ristau, R Ranjan, R Rauch, GC Habermeier, C Sinclair, R 1999 International Magnetics Conference (INTERMAG 99) May 18-21, 1999 Kyongju, south korea IEEE Magnet Soc Part 1",

year = "1999",

doi = "10.1109/20.800967",

language = "English",

volume = "35",

pages = "2730--2732",

journal = "Ieee Transactions on Magnetics",

issn = "0018-9464",

publisher = "IEEE",

number = "5",

}

TY - JOUR

T1 - Case study of media noise mechanisms in longitudinal recording

AU - Yen, Edward T.

AU - Wu, Stella Z.

AU - Thomson, Thomas

AU - Ristau, Roger

AU - Ranjan, Rajiv

AU - Rauch, Gary C.

AU - Habermeier, Claus

AU - Sinclair, Robert

N1 - Yen, ET Wu, SZ Thomson, T Ristau, R Ranjan, R Rauch, GC Habermeier, C Sinclair, R 1999 International Magnetics Conference (INTERMAG 99) May 18-21, 1999 Kyongju, south korea IEEE Magnet Soc Part 1

PY - 1999

Y1 - 1999

N2 - A comprehensive study (TEM, MFM, AFM, XRD, Recording Performance and Magnetometry) of media noise mechanisms and their relation to grain structure is reported for model, high noise contrast, CoCrPtTa thin films. The CoCrPtTa media were sputtered on to either CrMn or NiAl/CrMn underlayers causing a change in media noise power of 9dB. The changes in media noise are not related to the topography of the underlayer(s) or due to interaction effects, which the δM technique suggests are negligible in these model samples. A quantitative correlation is obtained between magnetic cluster size and media noise using an analytical first approximation of Zhou and Bertram's micromagnetic model. © 1999 IEEE.

AB - A comprehensive study (TEM, MFM, AFM, XRD, Recording Performance and Magnetometry) of media noise mechanisms and their relation to grain structure is reported for model, high noise contrast, CoCrPtTa thin films. The CoCrPtTa media were sputtered on to either CrMn or NiAl/CrMn underlayers causing a change in media noise power of 9dB. The changes in media noise are not related to the topography of the underlayer(s) or due to interaction effects, which the δM technique suggests are negligible in these model samples. A quantitative correlation is obtained between magnetic cluster size and media noise using an analytical first approximation of Zhou and Bertram's micromagnetic model. © 1999 IEEE.

KW - Longitudinal media

KW - Noise

KW - Underlayer effect

U2 - 10.1109/20.800967

DO - 10.1109/20.800967

M3 - Article

SN - 0018-9464

VL - 35

SP - 2730

EP - 2732

JO - Ieee Transactions on Magnetics

JF - Ieee Transactions on Magnetics

IS - 5

ER -

Case study of media noise mechanisms in longitudinal recording

Abstract

Keywords

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