Abstract
Interfacial intermixing and electronic structure were investigated at thin (3-5 unit cells.), epitaxial La(1) _ (x)Al(1+x)O(3)/SrTiO(3)(001) heterojunctions for x = 0 and +/- 0.05. Angle-resolved X-ray photoelectron spectroscopy reveals rather extensive cation intermixing for all films, independent of composition. The valence band offset for the nominally stoichiometric (x =0) film is 0.16 +/- 0.10 eV, with the valence band maximum of SrTiO(3) being deeper in binding energy than that of LaAlO(3). Similar values are obtained for x = +/- 0.05. There is no measurable band bending in either the LaAlO(3) or the SrTiO(3) near the interface. These results are at odds with first principles theoretical predictions based on perfect stoichiometry and an abrupt interface model. However, inclusion of intermixing in the compositional description of the interface results in successful prediction of the valence band offset and absence of band bending. 2011 Published by Elsevier B.V.
Original language | English |
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Pages (from-to) | 1381-1387 |
Number of pages | 7 |
Journal | Surface Science |
Volume | 605 |
Issue number | 15-16 |
DOIs | |
Publication status | Published - 2011 |
Keywords
- LaAlO(3)/SrTiO(3) interface
- Cation intermixing
- INTERFACES
- DENSITY
- AUGER