Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	60-62
Number of pages	3
Publication status	Published - 2022
Event	Microscopy and Microanalysis 2022 - Duration: 31 Jul 2022 → …

Conference	Microscopy and Microanalysis 2022
Period	31/07/22 → …

Cite this

@conference{4a01a69abe8f41d0ae1ebe56322ee08e,

title = "Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions",

author = "Xiangli Zhong and Xiaorong Zhou and Sarah Haigh and Philip Withers and Burke, {M. Grace}",

year = "2022",

language = "English",

pages = "60--62",

note = "Microscopy and Microanalysis 2022 ; Conference date: 31-07-2022",

}