Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Microscopy and Microanalysis 2022, 31/07/22
DOIs	https://doi.org/10.1017/S1431927622001155
Publication status	Published - 1 Jan 2022

Access to Document

@inproceedings{11730568a6524e39bebac1a69a79a186,

title = "Challenges in FIB TEM Sample Preparation: Damage Issues and Solutions",

author = "Xiangli Zhong and Xiaorong Zhou and Sarah Haigh and Philip Withers and Burke, \{M. G.\}",

year = "2022",

month = jan,

day = "1",

doi = "10.1017/S1431927622001155",

language = "English",

booktitle = "Microscopy and Microanalysis 2022, 31/07/22",

}