Characterisation of carbon films containing boron and nitrogen

Carbon films containing small quantities of boron and nitrogen have been prepared using a dual ion beam system. The films have been characterised using surface analytical techniques and by transmission electron microscopy and diffraction. Small crystallites of alpha-carbine or Ries-crater carbon have been identified in these mainly amorphous films. The substrates used were glass, stainless steel, silicon, germanium and single crystal sodium chloride. The incorporation of boron and nitrogen produced films adherent to all of the substrate materials. These films were resistant to temperature variation, acid and chemical attack. Optical properties of the films have been evaluated. The liquid impact damage thresholds for the films deposited on germanium have been determined and suggest an improvement on the damage threshold for bulk germanium. The results of Raman spectroscopy support the microbeam analysis findings.