Characterisation of Size Distribution and Positional Misalignment of Nanoscale Islands by Small-Angle X-ray Scattering

Georg Heldt; Philip Thompson; Rajesh V. Chopdekar; Joachim Kohlbrecher; Stephen  Lee; Laura J. Heyderman; Thomas Thomson

doi:10.1063/1.5050882

Characterisation of Size Distribution and Positional Misalignment of Nanoscale Islands by Small-Angle X-ray Scattering

Georg Heldt, Philip Thompson, Rajesh V. Chopdekar, Joachim Kohlbrecher, Stephen Lee, Laura J. Heyderman, Thomas Thomson

Nano Engineering and Spintronic Technologies

Research output: Contribution to journal › Article › peer-review

Abstract

Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications and data storage as Bit Patterned Media (BPM). We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy (SEM) images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate and statistically reliable method for characterising arrays of ordered nanostructures.

Original language	English
Journal	Journal of Applied Physics
Early online date	2 Jan 2019
DOIs	https://doi.org/10.1063/1.5050882
Publication status	Published - 2019

Access to Document

10.1063/1.5050882Licence: CC BY

Cite this

@article{6e984712a2dd488fa6b7cf0bab8aebdb,

title = "Characterisation of Size Distribution and Positional Misalignment of Nanoscale Islands by Small-Angle X-ray Scattering",

abstract = "Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications and data storage as Bit Patterned Media (BPM). We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy (SEM) images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate and statistically reliable method for characterising arrays of ordered nanostructures.",

author = "Georg Heldt and Philip Thompson and Chopdekar, {Rajesh V.} and Joachim Kohlbrecher and Stephen Lee and Heyderman, {Laura J.} and Thomas Thomson",

year = "2019",

doi = "10.1063/1.5050882",

language = "English",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Characterisation of Size Distribution and Positional Misalignment of Nanoscale Islands by Small-Angle X-ray Scattering

AU - Heldt, Georg

AU - Thompson, Philip

AU - Chopdekar, Rajesh V.

AU - Kohlbrecher, Joachim

AU - Lee, Stephen

AU - Heyderman, Laura J.

AU - Thomson, Thomas

PY - 2019

Y1 - 2019

N2 - Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications and data storage as Bit Patterned Media (BPM). We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy (SEM) images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate and statistically reliable method for characterising arrays of ordered nanostructures.

AB - Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications and data storage as Bit Patterned Media (BPM). We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy (SEM) images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate and statistically reliable method for characterising arrays of ordered nanostructures.

U2 - 10.1063/1.5050882

DO - 10.1063/1.5050882

M3 - Article

SN - 0021-8979

JO - Journal of Applied Physics

JF - Journal of Applied Physics

ER -

Characterisation of Size Distribution and Positional Misalignment of Nanoscale Islands by Small-Angle X-ray Scattering

Abstract

Access to Document

Fingerprint

Cite this