Characterisation of the kratos axis ultra with spherical mirror analyser for XPS imaging

John Walton; Neal Fairley

doi:10.1002/sia.2381

Characterisation of the kratos axis ultra with spherical mirror analyser for XPS imaging

John Walton, Neal Fairley

Research output: Contribution to journal › Article › peer-review

Abstract

The imaging performance of an XPS instrument employing a spherical mirror electron energy analyser has been characterised by measuring the peak position, full width at half maximum (FWHM), and lineshape, at every pixel in the image, for different modes of operation. Changes in these parameters have been identified and recommendations made for quantification of, and chemical state determination from, spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

Original language	English
Pages (from-to)	1230-1235
Number of pages	5
Journal	Surface and Interface Analysis
Volume	38
Issue number	8
DOIs	https://doi.org/10.1002/sia.2381
Publication status	Published - Aug 2006

Keywords

Image
Spectromicroscopy
Spectrum image
Spherical mirror analyser
XPS

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10.1002/sia.2381

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@article{29cac64d120049a086e2ce2ef9ee33c3,

title = "Characterisation of the kratos axis ultra with spherical mirror analyser for XPS imaging",

abstract = "The imaging performance of an XPS instrument employing a spherical mirror electron energy analyser has been characterised by measuring the peak position, full width at half maximum (FWHM), and lineshape, at every pixel in the image, for different modes of operation. Changes in these parameters have been identified and recommendations made for quantification of, and chemical state determination from, spectrum image data sets. Copyright {\textcopyright} 2006 John Wiley & Sons, Ltd.",

keywords = "Image, Spectromicroscopy, Spectrum image, Spherical mirror analyser, XPS",

author = "John Walton and Neal Fairley",

year = "2006",

month = aug,

doi = "10.1002/sia.2381",

language = "English",

volume = "38",

pages = "1230--1235",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley & Sons Ltd",

number = "8",

}

TY - JOUR

T1 - Characterisation of the kratos axis ultra with spherical mirror analyser for XPS imaging

AU - Walton, John

AU - Fairley, Neal

PY - 2006/8

Y1 - 2006/8

N2 - The imaging performance of an XPS instrument employing a spherical mirror electron energy analyser has been characterised by measuring the peak position, full width at half maximum (FWHM), and lineshape, at every pixel in the image, for different modes of operation. Changes in these parameters have been identified and recommendations made for quantification of, and chemical state determination from, spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

AB - The imaging performance of an XPS instrument employing a spherical mirror electron energy analyser has been characterised by measuring the peak position, full width at half maximum (FWHM), and lineshape, at every pixel in the image, for different modes of operation. Changes in these parameters have been identified and recommendations made for quantification of, and chemical state determination from, spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

KW - Image

KW - Spectromicroscopy

KW - Spectrum image

KW - Spherical mirror analyser

KW - XPS

U2 - 10.1002/sia.2381

DO - 10.1002/sia.2381

M3 - Article

SN - 0142-2421

VL - 38

SP - 1230

EP - 1235

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 8

ER -

Characterisation of the kratos axis ultra with spherical mirror analyser for XPS imaging

Abstract

Keywords

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