Characterization of buried interfaces using Ga Kα Hard X-ray Photoelectron Spectroscopy (HAXPES)

Ben Spencer, Stephen Church, P. Thompson, David Cant, Suresh Maniyarasu, A. Theodosiou, A. N. Jones, M. J. Kappers, David Binks, R. A. Oliver, J. Higgins, Andrew Thomas, Thomas Thomson, A G Shard, Wendy Flavell

Research output: Contribution to journal › Article › peer-review

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Hard X-ray Photoelectron Spectroscopy (HAXPES)
Spencer, B. (Senior Technical Specialist) & Flavell, W. (Academic lead)
Faculty of Science and Engineering
Facility/equipment: Facility
Surface Characterisation
Spencer, B. (Platform Lead), Nikiel, M. (Technical Specialist), Sheraz, S. (Technical Specialist), Li, K. (Technical Specialist), Dwyer, L. (Technical Specialist), Wall, S. (Technical Specialist), Williams, W. (Technical Specialist), Forrest, A. (Senior Technician), Fong, J. (Senior Technician), Filip, T. (Technician) & Moore, K. (Academic lead)
FSE Research
Facility/equipment: Platform

Equipment