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Characterization of buried interfaces using Ga Kα Hard X-ray Photoelectron Spectroscopy (HAXPES)
Ben Spencer, Stephen Church, P. Thompson, David Cant, Suresh Maniyarasu, A. Theodosiou, A. N. Jones, M. J. Kappers, David Binks, R. A. Oliver, J. Higgins, Andrew Thomas, Thomas Thomson, A G Shard, Wendy Flavell
Research output: Contribution to journal › Article › peer-review
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