Characterization of ion beam synthesized materials using microscope-spectrophotometry

Rachel M. Geatches; Karen J. Reeson; Alan J. Criddle; Mark S. Finney; Milton A. Harry; Roger P. Webb; Peter J. Pearson

Characterization of ion beam synthesized materials using microscope-spectrophotometry

Rachel M. Geatches^*, Karen J. Reeson, Alan J. Criddle, Mark S. Finney, Milton A. Harry, Roger P. Webb, Peter J. Pearson

^*Corresponding author for this work

University of Surrey

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, the technique of microscope-spectrophotometry, used to nondestructively characterize the microstructure of ion beam synthesized iron-disilicide layers, is described. The results obtained agree extremely well, in terms of layer thickness and interfacial roughness, with those from Rutherford backscattering. The results also show that it is possible to interpret the measured spectral reflectance data in terms of: 1) defect annealing; 2) iron redistribution; and 3) phase transformations from the β to the α phase.

Original language	English
Title of host publication	Materials Research Society Symposium Proceedings
Editors	Anthony F. Garito, Alex K-Y. Jen, Charles Y-C. Lee, Larry R. Dalton
Publisher	Materials Research Society
Pages	813-818
Number of pages	6
Volume	316
ISBN (Print)	1558992154
Publication status	Published - 1994
Event	Proceedings of the MRS 1993 Fall Meeting - Boston, MA, USA Duration: 29 Nov 1993 → 3 Dec 1993

Conference

Conference	Proceedings of the MRS 1993 Fall Meeting
City	Boston, MA, USA
Period	29/11/93 → 3/12/93

Cite this

Geatches, R. M., Reeson, K. J., Criddle, A. J., Finney, M. S., Harry, M. A., Webb, R. P., & Pearson, P. J. (1994). Characterization of ion beam synthesized materials using microscope-spectrophotometry. In A. F. Garito, A. K.-Y. Jen, C. Y.-C. Lee, & L. R. Dalton (Eds.), Materials Research Society Symposium Proceedings (Vol. 316, pp. 813-818). Materials Research Society.

@inproceedings{86273c09e6ba4387b34f8d6e254f4420,

title = "Characterization of ion beam synthesized materials using microscope-spectrophotometry",

abstract = "In this paper, the technique of microscope-spectrophotometry, used to nondestructively characterize the microstructure of ion beam synthesized iron-disilicide layers, is described. The results obtained agree extremely well, in terms of layer thickness and interfacial roughness, with those from Rutherford backscattering. The results also show that it is possible to interpret the measured spectral reflectance data in terms of: 1) defect annealing; 2) iron redistribution; and 3) phase transformations from the β to the α phase.",

author = "Geatches, {Rachel M.} and Reeson, {Karen J.} and Criddle, {Alan J.} and Finney, {Mark S.} and Harry, {Milton A.} and Webb, {Roger P.} and Pearson, {Peter J.}",

year = "1994",

language = "English",

isbn = "1558992154",

volume = "316",

pages = "813--818",

editor = "Garito, {Anthony F.} and Jen, {Alex K-Y.} and Lee, {Charles Y-C.} and Dalton, {Larry R.}",

booktitle = "Materials Research Society Symposium Proceedings",

publisher = "Materials Research Society",

address = "United States",

note = "Proceedings of the MRS 1993 Fall Meeting ; Conference date: 29-11-1993 Through 03-12-1993",

}

Geatches, RM, Reeson, KJ, Criddle, AJ, Finney, MS, Harry, MA, Webb, RP & Pearson, PJ 1994, Characterization of ion beam synthesized materials using microscope-spectrophotometry. in AF Garito, AK-Y Jen, CY-C Lee & LR Dalton (eds), Materials Research Society Symposium Proceedings. vol. 316, Materials Research Society, pp. 813-818, Proceedings of the MRS 1993 Fall Meeting, Boston, MA, USA, 29/11/93.

Characterization of ion beam synthesized materials using microscope-spectrophotometry. / Geatches, Rachel M.; Reeson, Karen J.; Criddle, Alan J. et al.
Materials Research Society Symposium Proceedings. ed. / Anthony F. Garito; Alex K-Y. Jen; Charles Y-C. Lee; Larry R. Dalton. Vol. 316 Materials Research Society, 1994. p. 813-818.

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Characterization of ion beam synthesized materials using microscope-spectrophotometry

AU - Geatches, Rachel M.

AU - Reeson, Karen J.

AU - Criddle, Alan J.

AU - Finney, Mark S.

AU - Harry, Milton A.

AU - Webb, Roger P.

AU - Pearson, Peter J.

PY - 1994

Y1 - 1994

N2 - In this paper, the technique of microscope-spectrophotometry, used to nondestructively characterize the microstructure of ion beam synthesized iron-disilicide layers, is described. The results obtained agree extremely well, in terms of layer thickness and interfacial roughness, with those from Rutherford backscattering. The results also show that it is possible to interpret the measured spectral reflectance data in terms of: 1) defect annealing; 2) iron redistribution; and 3) phase transformations from the β to the α phase.

AB - In this paper, the technique of microscope-spectrophotometry, used to nondestructively characterize the microstructure of ion beam synthesized iron-disilicide layers, is described. The results obtained agree extremely well, in terms of layer thickness and interfacial roughness, with those from Rutherford backscattering. The results also show that it is possible to interpret the measured spectral reflectance data in terms of: 1) defect annealing; 2) iron redistribution; and 3) phase transformations from the β to the α phase.

UR - http://www.scopus.com/inward/record.url?scp=0028342287&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028342287

SN - 1558992154

VL - 316

SP - 813

EP - 818

BT - Materials Research Society Symposium Proceedings

A2 - Garito, Anthony F.

A2 - Jen, Alex K-Y.

A2 - Lee, Charles Y-C.

A2 - Dalton, Larry R.

PB - Materials Research Society

T2 - Proceedings of the MRS 1993 Fall Meeting

Y2 - 29 November 1993 through 3 December 1993

ER -

Characterization of ion beam synthesized materials using microscope-spectrophotometry

Abstract

Conference

Other files and links

Fingerprint

Cite this