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Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
C. Trager-Cowan*, F. Sweeney, A. J. Wilkinson, P. W. Trimby, Austin Day, A. Gholinia, N. H. Schmidt, P. J. Parbrook, I. M. Watson
*Corresponding author for this work
Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review