Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques

R. Sánchez-Tovar; R. Leiva-García; J. García-Antón

doi:10.1016/j.tsf.2014.12.024

Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques

R. Sánchez-Tovar, R. Leiva-García, J. García-Antón^*

^*Corresponding author for this work

Materials Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemical techniques, namely potentiodynamic polarization curves and electrochemical impedance spectroscopy. The results show an increase in the amount of oxides (particularly γ-Fe₂O₃ and Fe₃O₄) with temperature. Regarding the electrochemical properties of these films, the corrosion resistance of the film tends to be lower with the heat treatment temperature, probably due to a more porous and heterogeneous scale. Mott-Schottky plots show the n-type semiconductive behavior of the films with donor densities that decrease with the enhancement of the temperature.

Original language	English
Pages (from-to)	1-10
Number of pages	10
Journal	Thin Solid Films
Volume	576
DOIs	https://doi.org/10.1016/j.tsf.2014.12.024
Publication status	Published - 2 Feb 2015

Keywords

Confocal laser microscopy
Electrochemical impedance spectroscopy
Oxidation
Passivation
Raman spectroscopy
Stainless steel

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10.1016/j.tsf.2014.12.024

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title = "Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques",

abstract = "In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemical techniques, namely potentiodynamic polarization curves and electrochemical impedance spectroscopy. The results show an increase in the amount of oxides (particularly γ-Fe2O3 and Fe3O4) with temperature. Regarding the electrochemical properties of these films, the corrosion resistance of the film tends to be lower with the heat treatment temperature, probably due to a more porous and heterogeneous scale. Mott-Schottky plots show the n-type semiconductive behavior of the films with donor densities that decrease with the enhancement of the temperature.",

keywords = "Confocal laser microscopy, Electrochemical impedance spectroscopy, Oxidation, Passivation, Raman spectroscopy, Stainless steel",

author = "R. S{\'a}nchez-Tovar and R. Leiva-Garc{\'i}a and J. Garc{\'i}a-Ant{\'o}n",

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journal = "Thin Solid Films",

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T1 - Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques

AU - Sánchez-Tovar, R.

AU - Leiva-García, R.

AU - García-Antón, J.

PY - 2015/2/2

Y1 - 2015/2/2

N2 - In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemical techniques, namely potentiodynamic polarization curves and electrochemical impedance spectroscopy. The results show an increase in the amount of oxides (particularly γ-Fe2O3 and Fe3O4) with temperature. Regarding the electrochemical properties of these films, the corrosion resistance of the film tends to be lower with the heat treatment temperature, probably due to a more porous and heterogeneous scale. Mott-Schottky plots show the n-type semiconductive behavior of the films with donor densities that decrease with the enhancement of the temperature.

AB - In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemical techniques, namely potentiodynamic polarization curves and electrochemical impedance spectroscopy. The results show an increase in the amount of oxides (particularly γ-Fe2O3 and Fe3O4) with temperature. Regarding the electrochemical properties of these films, the corrosion resistance of the film tends to be lower with the heat treatment temperature, probably due to a more porous and heterogeneous scale. Mott-Schottky plots show the n-type semiconductive behavior of the films with donor densities that decrease with the enhancement of the temperature.

KW - Confocal laser microscopy

KW - Electrochemical impedance spectroscopy

KW - Oxidation

KW - Passivation

KW - Raman spectroscopy

KW - Stainless steel

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DO - 10.1016/j.tsf.2014.12.024

M3 - Article

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SN - 0040-6090

VL - 576

SP - 1

EP - 10

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques

Abstract

Keywords

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