TY - JOUR
T1 - Charge injection compensation for charge/discharge capacitance measuring circuits used in tomography systems
AU - Yang, W.Q.
PY - 1996
Y1 - 1996
N2 - The charge/discharge capacitance measuring circuits used in electrical capacitance tomography (ECT) systems employ CMOS switches to control the charge/discharge operation. The gate-channel capacitances of these switches inject additional charges into the measuring circuits, reducing system accuracy. This paper describes a method for compensating these charge injection signals and for obtaining absolute capacitance measurements. The system errors are analysed and the measurement accuracy is assessed. Experimental results show that the charge/discharge circuit with charge injection compensation can measure small capacitance values, down to a few femtofarads in magnitude.
AB - The charge/discharge capacitance measuring circuits used in electrical capacitance tomography (ECT) systems employ CMOS switches to control the charge/discharge operation. The gate-channel capacitances of these switches inject additional charges into the measuring circuits, reducing system accuracy. This paper describes a method for compensating these charge injection signals and for obtaining absolute capacitance measurements. The system errors are analysed and the measurement accuracy is assessed. Experimental results show that the charge/discharge circuit with charge injection compensation can measure small capacitance values, down to a few femtofarads in magnitude.
KW - Tomography
KW - Electric impedance tomography
KW - Capacitance tomography
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0030193375&partnerID=MN8TOARS
UR - https://www.scopus.com/pages/publications/0030193375
U2 - 10.1088/0957-0233/7/7/012
DO - 10.1088/0957-0233/7/7/012
M3 - Article
SN - 0957-0233
VL - 7
SP - 1073
EP - 1078
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 7
ER -