ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing

Haiyang Yang; Yulu Zhou; Tian Liang; Li Kuang

doi:10.1109/JIOT.2025.3531512

ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing

Haiyang Yang, Yulu Zhou, Tian Liang, Li Kuang

Division of Pharmacy & Optometry

Central South University

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	IEEE Internet of Things Journal
DOIs	https://doi.org/10.1109/JIOT.2025.3531512
Publication status	Published - 20 Jan 2025

Keywords

Information Retrieval
Large Language Models
ChatGPT

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/JIOT.2025.3531512

Cite this

@article{b855bf3ec2d8464284ab743b3341c828,

title = "ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing",

keywords = "Information Retrieval, Large Language Models, ChatGPT",

author = "Haiyang Yang and Yulu Zhou and Tian Liang and Li Kuang",

year = "2025",

month = jan,

day = "20",

doi = "10.1109/JIOT.2025.3531512",

language = "English",

journal = "IEEE Internet of Things Journal",

issn = "2327-4662",

publisher = "IEEE",

}

TY - JOUR

T1 - ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing

AU - Yang, Haiyang

AU - Zhou, Yulu

AU - Liang, Tian

AU - Kuang, Li

PY - 2025/1/20

Y1 - 2025/1/20

KW - Information Retrieval

KW - Large Language Models

KW - ChatGPT

UR - https://doi.org/10.1109/JIOT.2025.3531512

U2 - 10.1109/JIOT.2025.3531512

DO - 10.1109/JIOT.2025.3531512

M3 - Article

SN - 2327-4662

JO - IEEE Internet of Things Journal

JF - IEEE Internet of Things Journal

ER -

ChatDL: An LLM-Based Defect Localization Approach for Software in IIoT Flexible Manufacturing

Keywords

UN SDGs

Access to Document

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