Chemical Analysis of Solid Insulation Degradation using the AFM-IR Technique

Simon Rowland, Pablo Daniel Bastidas Erazo, Harry Mcdonald, Suzanne Morsch

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    334 Downloads (Pure)

    Abstract

    To enable the continued development of power transmission cabling, an understanding of the processes which result in their failures is essential. In order to do so, powerful analysis techniques are required. However, those which consider chemical degradation are lagging behind those for visible degradation. This paper presents the Atomic Force Microscopy - Infrared Spectroscopy (AFM-IR) chemical analysis technique, which can provide surface chemical analysis with resolution of ~50 nm across the infrared spectrum. Two cases are considered: interfacial tracking between epoxy and silicone rubber, and the degraded region formed in front of a needle tip in the electrical tree initiation process. The results obtained using AFM-IR are compared to the outcomes from other techniques. It is found that AFM-IR offers a unique and powerful insight into visible and non-visible degradation of solid dielectrics.
    Original languageEnglish
    Title of host publicationIEEE International Conference on Dielectrics
    PublisherIEEE
    DOIs
    Publication statusE-pub ahead of print - 1 Nov 2018

    Fingerprint

    Dive into the research topics of 'Chemical Analysis of Solid Insulation Degradation using the AFM-IR Technique'. Together they form a unique fingerprint.

    Cite this