Abstract
A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image anal. of SEM and TEM images was compared to the phase fraction est. obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estd. correctly when using quant. Rietveld refinement. [on SciFinder(R)]
Original language | English |
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Pages (from-to) | 1248-1256 |
Number of pages | 9 |
Journal | Mater. Charact. |
Volume | 60 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2009 |
Keywords
- Electron diffraction
- Grain size
- Texture
- X-ray diffractometry (comparative detn. of α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy)
- Metallography (electron
- comparative detn. of α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy)
- titanium alloy alpha beta phase fraction microscopy diffractometry