Abstract
The composition of InxGa1-xN nanorods grown by molecular beam epitaxy with nominal x=0.5 has been mapped by electron microscopy using Z-contrast imaging and x-ray microanalysis. This shows a coherent and highly strained core-shell structure with a near-atomically sharp boundary between a Ga-rich shell (x∼0.3) and an In-rich core (x∼0.7), which itself has In- and Ga-rich platelets alternating along the growth axis. It is proposed that the shell and core regions are lateral and vertical growth sectors, with the core structure determined by spinodal decomposition. © 2014 IOP Publishing Ltd.
| Original language | English |
|---|---|
| Article number | 215705 |
| Journal | Nanotechnology |
| Volume | 25 |
| Issue number | 21 |
| DOIs | |
| Publication status | Published - 30 May 2014 |
Keywords
- core-shell structures
- EDX mapping
- InGaN nanorods
- molecular beam epitaxy
- spinodal decomposition
- transmission electron microscopy