Compositional variations in In0.5Ga0.5N nanorods grown by molecular beam epitaxy

Sarah Haigh, D. Cherns, R. F. Webster, S. V. Novikov, C. T. Foxon, A. M. Fischer, F. A. Ponce, S. J. Haigh

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The composition of InxGa1-xN nanorods grown by molecular beam epitaxy with nominal x=0.5 has been mapped by electron microscopy using Z-contrast imaging and x-ray microanalysis. This shows a coherent and highly strained core-shell structure with a near-atomically sharp boundary between a Ga-rich shell (x∼0.3) and an In-rich core (x∼0.7), which itself has In- and Ga-rich platelets alternating along the growth axis. It is proposed that the shell and core regions are lateral and vertical growth sectors, with the core structure determined by spinodal decomposition. © 2014 IOP Publishing Ltd.
    Original languageEnglish
    Article number215705
    JournalNanotechnology
    Volume25
    Issue number21
    DOIs
    Publication statusPublished - 30 May 2014

    Keywords

    • core-shell structures
    • EDX mapping
    • InGaN nanorods
    • molecular beam epitaxy
    • spinodal decomposition
    • transmission electron microscopy

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