Controlling relative fundamental crystal growth rates in silicalite: AFM observation

L. Itzel Meza; Michael W. Anderson; Jonathan R. Agger; Colin S. Cundy; Chin B. Chong; Richard J. Plaisted

doi:10.1021/ja0739887

Controlling relative fundamental crystal growth rates in silicalite: AFM observation

L. Itzel Meza, Michael W. Anderson, Jonathan R. Agger, Colin S. Cundy, Chin B. Chong, Richard J. Plaisted

Research output: Contribution to journal › Article › peer-review

Abstract

A detailed atomic force microscopy study has been performed on the open-framework, microporous material silicalite. Emphasis has been placed on determining the effect of supersaturation on the crystal growth process. The relative rates of fundamental crystal growth processes can be substantially altered by tuning the supersaturation. In this manner, it is possible to, for instance, switch on and off surface nucleation while retaining terrace spreading. This offers a potential mechanism by which it might be possible to control important crystal aspects such as defect density and intergrowths. © 2007 American Chemical Society.

Original language	English
Pages (from-to)	15192-15201
Number of pages	9
Journal	Journal of the American Chemical Society
Volume	129
Issue number	49
DOIs	https://doi.org/10.1021/ja0739887
Publication status	Published - 12 Dec 2007

Keywords

ATOMIC-FORCE MICROSCOPY
ZEOLITE-A
SURFACE-STRUCTURE
SEMICONTINUOUS
REACTOR
CRYSTALLIZATION
NUCLEATION
SIMULATION

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10.1021/ja0739887

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title = "Controlling relative fundamental crystal growth rates in silicalite: AFM observation",

abstract = "A detailed atomic force microscopy study has been performed on the open-framework, microporous material silicalite. Emphasis has been placed on determining the effect of supersaturation on the crystal growth process. The relative rates of fundamental crystal growth processes can be substantially altered by tuning the supersaturation. In this manner, it is possible to, for instance, switch on and off surface nucleation while retaining terrace spreading. This offers a potential mechanism by which it might be possible to control important crystal aspects such as defect density and intergrowths. {\textcopyright} 2007 American Chemical Society.",

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author = "Meza, {L. Itzel} and Anderson, {Michael W.} and Agger, {Jonathan R.} and Cundy, {Colin S.} and Chong, {Chin B.} and Plaisted, {Richard J.}",

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year = "2007",

month = dec,

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language = "English",

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T1 - Controlling relative fundamental crystal growth rates in silicalite: AFM observation

AU - Meza, L. Itzel

AU - Anderson, Michael W.

AU - Agger, Jonathan R.

AU - Cundy, Colin S.

AU - Chong, Chin B.

AU - Plaisted, Richard J.

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PY - 2007/12/12

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N2 - A detailed atomic force microscopy study has been performed on the open-framework, microporous material silicalite. Emphasis has been placed on determining the effect of supersaturation on the crystal growth process. The relative rates of fundamental crystal growth processes can be substantially altered by tuning the supersaturation. In this manner, it is possible to, for instance, switch on and off surface nucleation while retaining terrace spreading. This offers a potential mechanism by which it might be possible to control important crystal aspects such as defect density and intergrowths. © 2007 American Chemical Society.

AB - A detailed atomic force microscopy study has been performed on the open-framework, microporous material silicalite. Emphasis has been placed on determining the effect of supersaturation on the crystal growth process. The relative rates of fundamental crystal growth processes can be substantially altered by tuning the supersaturation. In this manner, it is possible to, for instance, switch on and off surface nucleation while retaining terrace spreading. This offers a potential mechanism by which it might be possible to control important crystal aspects such as defect density and intergrowths. © 2007 American Chemical Society.

KW - ATOMIC-FORCE MICROSCOPY

KW - ZEOLITE-A

KW - SURFACE-STRUCTURE

KW - SEMICONTINUOUS

KW - REACTOR

KW - CRYSTALLIZATION

KW - NUCLEATION

KW - SIMULATION

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EP - 15201

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

IS - 49

ER -

Controlling relative fundamental crystal growth rates in silicalite: AFM observation

Abstract

Keywords

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