Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) Serial Section Tomography (SST)

Ali Gholinia, Philip Withers (Collaborator), Kevin Taylor (Collaborator), Matthew Curd (Collaborator), Etienne Bousser (Collaborator), Thijs Hosman (Collaborator), Steven Coyle (Collaborator), Michael Hassel-Shearer (Collaborator), John Hunt (Collaborator)

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