Creep Strain Uncertainties Associated with Testpiece Extensometer Ridges: Their Identification and Reduction

David R Hayhurst, J Lin, Z Kowalewski, B Dyson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya
Pages	375-390
Number of pages	16
Publication status	Published - 2001
Event	Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya - Duration: 1 Jan 1824 → …

Conference	Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya
Period	1/01/24 → …

Cite this

@inproceedings{a82d2345aed94a50a92660d6e6158e15,

title = "Creep Strain Uncertainties Associated with Testpiece Extensometer Ridges: Their Identification and Reduction",

author = "Hayhurst, {David R} and J Lin and Z Kowalewski and B Dyson",

year = "2001",

language = "English",

pages = "375--390",

booktitle = "Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya",

note = "Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya ; Conference date: 01-01-1824",

}

TY - GEN

T1 - Creep Strain Uncertainties Associated with Testpiece Extensometer Ridges: Their Identification and Reduction

AU - Hayhurst, David R

AU - Lin, J

AU - Kowalewski, Z

AU - Dyson, B

PY - 2001

Y1 - 2001

M3 - Conference contribution

SP - 375

EP - 390

BT - Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya

T2 - Proc. 5th IUTAM Symp. On Creep in Structures, Nagoya

Y2 - 1 January 1824

ER -