Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

Sarah J. Haigh; Aidan P. Rooney; Eric Prestat; Fred Withers; O. Del Pozo Zamudio; Artem Mishchenko; Ali Gholinia; K. Watanabe; T. Taniguchi; A. I. Tartakovskii; Andre K. Geim; Konstantin S. Novoselov

doi:10.1017/S1431927615001336

Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

Sarah J. Haigh, Aidan P. Rooney, Eric Prestat, Fred Withers, O. Del Pozo Zamudio, Artem Mishchenko, Ali Gholinia, K. Watanabe, T. Taniguchi, A. I. Tartakovskii, Andre K. Geim, Konstantin S. Novoselov

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	0054
Pages (from-to)	107-108
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	21
Issue number	S3
DOIs	https://doi.org/10.1017/S1431927615001336
Publication status	Published - 1 Aug 2015
Event	Microscopy & Microanalysis 2015 Meeting - Oregon Convention Center, Portland, United States Duration: 2 Aug 2015 → 6 Aug 2015 https://www.microscopy.org/MandM/2015/

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National Graphene Institute

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Haigh, S. J., Rooney, A. P., Prestat, E., Withers, F., Del Pozo Zamudio, O., Mishchenko, A., Gholinia, A., Watanabe, K., Taniguchi, T., Tartakovskii, A. I., Geim, A. K., & Novoselov, K. S. (2015). Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices. Microscopy and Microanalysis, 21(S3), 107-108. Article 0054. https://doi.org/10.1017/S1431927615001336

@article{7493c0807d70450c93ac11c41037add4,

title = "Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices",

author = "Haigh, {Sarah J.} and Rooney, {Aidan P.} and Eric Prestat and Fred Withers and {Del Pozo Zamudio}, O. and Artem Mishchenko and Ali Gholinia and K. Watanabe and T. Taniguchi and Tartakovskii, {A. I.} and Geim, {Andre K.} and Novoselov, {Konstantin S.}",

year = "2015",

month = aug,

day = "1",

doi = "10.1017/S1431927615001336",

language = "English",

volume = "21",

pages = "107--108",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S3",

note = "Microscopy & Microanalysis 2015 Meeting ; Conference date: 02-08-2015 Through 06-08-2015",

url = "https://www.microscopy.org/MandM/2015/",

}

Haigh, SJ, Rooney, AP, Prestat, E, Withers, F, Del Pozo Zamudio, O, Mishchenko, A , Gholinia, A, Watanabe, K, Taniguchi, T, Tartakovskii, AI, Geim, AK & Novoselov, KS 2015, 'Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices', Microscopy and Microanalysis, vol. 21, no. S3, 0054, pp. 107-108. https://doi.org/10.1017/S1431927615001336

TY - JOUR

T1 - Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

AU - Haigh, Sarah J.

AU - Rooney, Aidan P.

AU - Prestat, Eric

AU - Withers, Fred

AU - Del Pozo Zamudio, O.

AU - Mishchenko, Artem

AU - Gholinia, Ali

AU - Watanabe, K.

AU - Taniguchi, T.

AU - Tartakovskii, A. I.

AU - Geim, Andre K.

AU - Novoselov, Konstantin S.

PY - 2015/8/1

Y1 - 2015/8/1

UR - http://www.scopus.com/inward/record.url?scp=84994310423&partnerID=8YFLogxK

U2 - 10.1017/S1431927615001336

DO - 10.1017/S1431927615001336

M3 - Article

AN - SCOPUS:84994310423

SN - 1431-9276

VL - 21

SP - 107

EP - 108

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S3

M1 - 0054

T2 - Microscopy & Microanalysis 2015 Meeting

Y2 - 2 August 2015 through 6 August 2015

ER -

Cross sectional STEM imaging and analysis of multilayered two dimensional crystal heterostructure devices

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