Cryogenic operation of silicon detectors

P. Collins, I. B M Barnett, P. Bartalini, W. Bell, P. Berglund, W. De Boer, S. Buontempo, K. Borer, T. Bowcock, J. Buytaert, L. Casagrande, V. Chabaud, P. Chochula, V. Cindro, C. Da Via, S. Devine, H. Dijkstra, B. Dezillie, Z. Dimcovski, O. DormondV. Eremin, A. Esposito, R. Frei, V. Granata, E. Grigoriev, F. Hauler, S. Heising, S. Janos, L. Jungermann, Z. Li, C. Lourenço, M. Mikuž, T. O. Niinikoski, V. O'Shea, V. G. Palmieri, S. Paul, C. Parkes, G. Ruggiero, T. Ruf, S. Saladino, L. Schmitt, K. Smith, I. Stavitski, E. Verbitskaya, F. Vitobello, M. Zavrtanik

    Research output: Contribution to journalArticlepeer-review

    Abstract

    This paper reports on measurements at cryogenic temperatures of a silicon microstrip detector irradiated with 24 GeV protons to a fluence of 3.5×1014 p/cm2 and of a p-n junction diode detector irradiated to a similar fluence. At temperatures below 130 K a recovery of charge collection efficiency and resolution is observed. Under reverse bias conditions this recovery degrades in time towards some saturated value. The recovery is interpreted qualitatively as changes in the effective space charge of the detector causing alterations in the depletion voltage.
    Original languageEnglish
    Pages (from-to)151-159
    Number of pages8
    JournalNuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
    Volume447
    Issue number1
    DOIs
    Publication statusPublished - 1 Jun 2000

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