Crystal form, defects and growth of the metal organic framework HKUST-1 revealed by atomic force microscopy

Maryiam Shöâeè; Jonathan R. Agger; Michael W. Anderson; Martin P. Attfield

doi:10.1039/b718890k

Crystal form, defects and growth of the metal organic framework HKUST-1 revealed by atomic force microscopy

Maryiam Shöâeè, Jonathan R. Agger, Michael W. Anderson, Martin P. Attfield

Research output: Contribution to journal › Article › peer-review

Abstract

Atomic force microscopy has been used to reveal features of the crystal form, types of defects and growth of the important member of the nanoporous metal organic framework family, HKUST-1. © The Royal Society of Chemistry 2008.

Original language	English
Pages (from-to)	646-648
Number of pages	2
Journal	CrystEngComm
Volume	10
Issue number	6
DOIs	https://doi.org/10.1039/b718890k
Publication status	Published - 2008

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title = "Crystal form, defects and growth of the metal organic framework HKUST-1 revealed by atomic force microscopy",

abstract = "Atomic force microscopy has been used to reveal features of the crystal form, types of defects and growth of the important member of the nanoporous metal organic framework family, HKUST-1. {\textcopyright} The Royal Society of Chemistry 2008.",

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AU - Anderson, Michael W.

AU - Attfield, Martin P.

PY - 2008

Y1 - 2008

N2 - Atomic force microscopy has been used to reveal features of the crystal form, types of defects and growth of the important member of the nanoporous metal organic framework family, HKUST-1. © The Royal Society of Chemistry 2008.

AB - Atomic force microscopy has been used to reveal features of the crystal form, types of defects and growth of the important member of the nanoporous metal organic framework family, HKUST-1. © The Royal Society of Chemistry 2008.

U2 - 10.1039/b718890k

DO - 10.1039/b718890k

M3 - Article

VL - 10

SP - 646

EP - 648

JO - CrystEngComm

JF - CrystEngComm

SN - 1466-8033

IS - 6

ER -

Crystal form, defects and growth of the metal organic framework HKUST-1 revealed by atomic force microscopy

Abstract

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