Defect formation in the Swift-Hohenberg equation

Tobias Galla, Esteban Moro

    Research output: Contribution to journalArticlepeer-review


    The validity of the Kibble-Zurek picture for the creation of defects in the annealing of the Swift-Hohenberg (SH) equation was confirmed. Specifically, a length scale ξ∼Γdef-1 directly related to the density of defects, was identified. As a result, it was found that it scales with the sweep rate as ξ∼μ-1/4.
    Original languageEnglish
    Article number035101
    Pages (from-to)035101/4
    JournalPhysical Review E - Statistical, Nonlinear, and Soft Matter Physics
    Issue number3
    Publication statusPublished - Mar 2003


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