Defect-impurity interactions in irradiated tin-doped Cz-Si crystals

L. I. Khirunenko, O. A. Kobzar, Yu V. Pomozov, M. G. Sosnin, N. A. Tripachko, V. P. Markevich*, L. I. Murin, A. R. Peaker

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

Results of a combined infrared absorption (IR) and deep-level transient spectroscopy (DLTS) study of defects induced by irradiation with fast electrons in Sn-doped Czochralski-grown Si crystals are reported. Tin atoms were found to interact effectively with vacancy as well as with interstitial-type radiation-induced defects. Manifestations of stable tin-vacancy and tin-interstitial carbon atom complexes were observed in DLTS and IR absorption spectra. Defect transformations upon heat-treatments of the irradiated samples were studied. Tin atoms were found to be effective traps for mobile vacancy-oxygen (V-O) complexes. A local vibrational mode of a Sn-V-O complex has been identified.

Original languageEnglish
Title of host publicationPhysica Status Solidi Conferences
PublisherJohn Wiley & Sons Ltd
Pages694-697
Number of pages4
Edition2
ISBN (Print)352740435X, 9783527404353
DOIs
Publication statusPublished - 1 Jan 2003
EventProceedings 10th International Conference on Shallow Level Centers in Semiconductors (SLCS-10) - Warsaw, Poland
Duration: 24 Jul 200227 Jul 2002

Publication series

NamePhysica Status Solidi Conferences
Number2

Conference

ConferenceProceedings 10th International Conference on Shallow Level Centers in Semiconductors (SLCS-10)
Country/TerritoryPoland
CityWarsaw
Period24/07/0227/07/02

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