Detector systems for use with an Electron Beam Ion Trap

FJ Currell, J Asada, T Fukami, H Hirayama, Nobuyuki Nakamura, K Motohashi, E Nojikawa, K Okazaki, S Ohtani, M Sakurai, H Shiraishi, S Tsurubuchi, H Watanabe

Research output: Contribution to journalArticlepeer-review

Abstract

This article describes two data systems, primarily for use with x-ray detectors in conjunction with an Electron Beam Ion Trap (EBIT). Both systems are designed from a common viewpoint that useful information should be presented in real-time whilst as much information as possible should be stored for subsequent off-line analysis.
Original languageEnglish
Pages (from-to)371-372
JournalPhysica Scripta
VolumeT73
Publication statusPublished - 1997

Research Beacons, Institutes and Platforms

  • Dalton Nuclear Institute

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