Direct determination of the crystallographic orientation of graphene edges by atomic resolution imaging

S. Neubeck, Y. M. You, Z. H. Ni, P. Blake, Z. X. Shen, A. K. Geim, K. S. Novoselov

    Research output: Contribution to journalArticlepeer-review

    Abstract

    In this letter, we show how high-resolution scanning tunneling microscopy (STM) imaging can be used to reveal that certain edges of micromechanically exfoliated single layer graphene crystals on silicon oxide follow either zigzag or armchair orientation. Using the cleavage technique, graphene flakes are obtained that very often show terminating edges seemingly following the crystallographic directions of the underlying honeycomb lattice. Performing atomic resolution STM-imaging on such flakes, we were able to directly prove this assumption. Raman imaging carried out on the same flakes further validated our findings. © 2010 American Institute of Physics.
    Original languageEnglish
    Article number053110
    JournalApplied Physics Letters
    Volume97
    Issue number5
    DOIs
    Publication statusPublished - 2 Aug 2010

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