Dislocation core structures in (0001) InGaN

S. L. Rhode, M. K. Horton, S. L. Sahonta, M. J. Kappers, S. J. Haigh, T. J. Pennycook, C. McAleese, C. J. Humphreys, R. O. Dusane, M. A. Moram

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Threading dislocation core structures in c-plane GaN and InxGa1- xN (0.057 ≤ x ≤ 0.20) films were investigated by aberration-corrected scanning transmission electron microscopy. a-type dislocations are unaffected by alloying with indium and have a 5/7-atom ring core structure in both GaN and InxGa1- xN. In contrast, the dissociation lengths of (a + c)-type dislocations are reduced, and new 7/4/9-atom ring and 7/4/8/5-atom ring core structures were observed for the dissociated (a + c)-type dislocations in InxGa1- xN, which is associated with the segregation of indium near (a + c)-type and c-type dislocation cores in InxGa1- xN, consistent with predictions from atomistic Monte Carlo simulations.

    Original languageEnglish
    Article number105301
    JournalJournal of Applied Physics
    Volume119
    Issue number10
    DOIs
    Publication statusPublished - 14 Mar 2016

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