Abstract
Threading dislocation core structures in c-plane GaN and InxGa1- xN (0.057 ≤ x ≤ 0.20) films were investigated by aberration-corrected scanning transmission electron microscopy. a-type dislocations are unaffected by alloying with indium and have a 5/7-atom ring core structure in both GaN and InxGa1- xN. In contrast, the dissociation lengths of (a + c)-type dislocations are reduced, and new 7/4/9-atom ring and 7/4/8/5-atom ring core structures were observed for the dissociated (a + c)-type dislocations in InxGa1- xN, which is associated with the segregation of indium near (a + c)-type and c-type dislocation cores in InxGa1- xN, consistent with predictions from atomistic Monte Carlo simulations.
Original language | English |
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Article number | 105301 |
Journal | Journal of Applied Physics |
Volume | 119 |
Issue number | 10 |
DOIs | |
Publication status | Published - 14 Mar 2016 |