Effect of parasitic resistance in electrical resistance tomography with voltage excitation

Mimi Faisyalini Ramli, Wuqiang Yang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2017 IEEE International Conference on Imaging Systems and Techniques, 18-20 Oct. 2017, Beijing, China
Publisher	IEEE
Publication status	Published - 2017

Cite this

@inproceedings{5967821e4fed4795bb0249509c20510b,

title = "Effect of parasitic resistance in electrical resistance tomography with voltage excitation",

author = "Ramli, {Mimi Faisyalini} and Wuqiang Yang",

year = "2017",

language = "English",

booktitle = "2017 IEEE International Conference on Imaging Systems and Techniques, 18-20 Oct. 2017, Beijing, China",

publisher = "IEEE",

address = "United States",

}