Effect of temperature on passive film formation of UNS N08031 Cr–Ni alloy in phosphoric acid contaminated with different aggressive anions

C. Escrivà-Cerdán; E. Blasco-Tamarit; D.M. García-García; J. García-Antón; R. Akid; Jean Walton

doi:10.1016/j.electacta.2013.08.040

Effect of temperature on passive film formation of UNS N08031 Cr–Ni alloy in phosphoric acid contaminated with different aggressive anions

C. Escrivà-Cerdán
, E. Blasco-Tamarit
, D.M. García-García
, J. García-Antón
, R. Akid
, Jean Walton

Research output: Contribution to journal › Article › peer-review

Abstract

The influence of temperature and the effect of aggressive anions on the electrochemical behaviour of UNS N08031 stainless steel in a contaminated phosphoric acid solution were evaluated. Stabilisation of the passive film was studied by potentiodynamic polarisation curves, potentiostatic tests, electrochemical impedance spectroscopy (EIS) measurements, Mott–Schottky analysis and X-ray photoelectron spectroscopy (XPS). The stability of the passive film was found to decrease as temperature increases. The film formed on the stainless steel surface was a n-type semiconductor and the XPS spectrum revealed the presence of fluoride ions.

Original language	English
Pages (from-to)	552-561
Number of pages	9
Journal	Electrochimica Acta
Volume	111
DOIs	https://doi.org/10.1016/j.electacta.2013.08.040
Publication status	Published - 30 Nov 2013

Keywords

Stainless steel
Acid solution
EIS
Mott–Schottky
XPS

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10.1016/j.electacta.2013.08.040

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title = "Effect of temperature on passive film formation of UNS N08031 Cr–Ni alloy in phosphoric acid contaminated with different aggressive anions",

abstract = "The influence of temperature and the effect of aggressive anions on the electrochemical behaviour of UNS N08031 stainless steel in a contaminated phosphoric acid solution were evaluated. Stabilisation of the passive film was studied by potentiodynamic polarisation curves, potentiostatic tests, electrochemical impedance spectroscopy (EIS) measurements, Mott–Schottky analysis and X-ray photoelectron spectroscopy (XPS). The stability of the passive film was found to decrease as temperature increases. The film formed on the stainless steel surface was a n-type semiconductor and the XPS spectrum revealed the presence of fluoride ions.",

keywords = "Stainless steel, Acid solution, EIS, Mott–Schottky, XPS",

author = "C. Escriv{\`a}-Cerd{\'a}n and E. Blasco-Tamarit and D.M. Garc{\'i}a-Garc{\'i}a and J. Garc{\'i}a-Ant{\'o}n and R. Akid and Jean Walton",

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doi = "10.1016/j.electacta.2013.08.040",

language = "English",

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journal = "Electrochimica Acta",

issn = "0013-4686",

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TY - JOUR

T1 - Effect of temperature on passive film formation of UNS N08031 Cr–Ni alloy in phosphoric acid contaminated with different aggressive anions

AU - Escrivà-Cerdán, C.

AU - Blasco-Tamarit, E.

AU - García-García, D.M.

AU - García-Antón, J.

AU - Akid, R.

AU - Walton, Jean

PY - 2013/11/30

Y1 - 2013/11/30

N2 - The influence of temperature and the effect of aggressive anions on the electrochemical behaviour of UNS N08031 stainless steel in a contaminated phosphoric acid solution were evaluated. Stabilisation of the passive film was studied by potentiodynamic polarisation curves, potentiostatic tests, electrochemical impedance spectroscopy (EIS) measurements, Mott–Schottky analysis and X-ray photoelectron spectroscopy (XPS). The stability of the passive film was found to decrease as temperature increases. The film formed on the stainless steel surface was a n-type semiconductor and the XPS spectrum revealed the presence of fluoride ions.

AB - The influence of temperature and the effect of aggressive anions on the electrochemical behaviour of UNS N08031 stainless steel in a contaminated phosphoric acid solution were evaluated. Stabilisation of the passive film was studied by potentiodynamic polarisation curves, potentiostatic tests, electrochemical impedance spectroscopy (EIS) measurements, Mott–Schottky analysis and X-ray photoelectron spectroscopy (XPS). The stability of the passive film was found to decrease as temperature increases. The film formed on the stainless steel surface was a n-type semiconductor and the XPS spectrum revealed the presence of fluoride ions.

KW - Stainless steel

KW - Acid solution

KW - EIS

KW - Mott–Schottky

KW - XPS

U2 - 10.1016/j.electacta.2013.08.040

DO - 10.1016/j.electacta.2013.08.040

M3 - Article

SN - 0013-4686

VL - 111

SP - 552

EP - 561

JO - Electrochimica Acta

JF - Electrochimica Acta

ER -

Effect of temperature on passive film formation of UNS N08031 Cr–Ni alloy in phosphoric acid contaminated with different aggressive anions

Abstract

Keywords

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