Electrical, electronic and optical characterisation of ion beam synthesised β-FeSi2 light emitting devices

M. A. Lourenço*, T. M. Butler, A. K. Kewell, R. M. Gwilliam, K. J. Kirkby, K. P. Homewood

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

β-FeSi2/Si light emitting devices (LEDs) have been attracting great interest since the first successful demonstration of an ion beam synthesised (IBS) device operating at a wavelength of 1.5 μm. We report here on a study of the electrical, electronic and optical properties of devices produced by Fe implantation into epitaxial silicon layers. The devices have been characterised by current-voltage (I-V), capacitance-voltage (C-V), deep level transient spectroscopy (DLTS) and electroluminescence (EL) measurements. DLTS showed the presence of a majority carrier trapping centre, with an activation energy of 200 ± 25 meV. Room temperature EL was observed from β-FeSi2/Si LEDs. Preliminary analysis of the EL results suggests its quench ratio depends on device structure; the quenching is thought to be related to surface recombination.

Original languageEnglish
Pages (from-to)159-163
Number of pages5
JournalNuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume175-177
DOIs
Publication statusPublished - Apr 2001

Keywords

  • Band offset
  • Deep level transient spectroscopy
  • Electroluminescence
  • Iron disilicide
  • Light emitting device

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