Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples

H. Xu; R. Akid; G. Brumpton; H. Wang; J. M. Rodenburg

Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples

H. Xu, R. Akid, G. Brumpton, H. Wang, J. M. Rodenburg

Research output: Chapter in Book/Conference proceeding › Chapter

Abstract

Atomic force microscopy (AFM) and scanning electron microscopy (SEM) have been used to study the surface characteristics and corrosion mechanisms of Ni/Cr electrocoats and Al2O3 sol-gel coats before and after accelerated corrosion tests in a 0.5% NaCl solution at 18°G The results of electrochemical tests show that the corrosion resistance of substrates has been much improved by the application of both coats, and the Al2O 3 coated sample exhibits the better anti-corrosion performance. Surface morphology observations revealed the presence of highly homogeneous and adherent films formed on the metal substrate during the sol-gel process. These films act as a barrier to prevent the substrate from corrosion in the aggressive environment. This sol-gel coating is therefore seen as a promising replacement for that of Cr6+ electroplating.

Original language	English
Title of host publication	Institute of Physics Conference Series\|Inst. Phys. Conf. Ser.
Publisher	CRC Press
Pages	417-420
Number of pages	3
Volume	179
Publication status	Published - 2004
Event	Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Oxford Duration: 1 Jul 2004 → … http://shura.shu.ac.uk/1084/

Publication series

Name	Institute of Physics Conference Series
Publisher	CRC Press
Volume	179

Other

Other	Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference
City	Oxford
Period	1/07/04 → …
Internet address	http://shura.shu.ac.uk/1084/

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title = "Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples",

abstract = "Atomic force microscopy (AFM) and scanning electron microscopy (SEM) have been used to study the surface characteristics and corrosion mechanisms of Ni/Cr electrocoats and Al2O3 sol-gel coats before and after accelerated corrosion tests in a 0.5% NaCl solution at 18°G The results of electrochemical tests show that the corrosion resistance of substrates has been much improved by the application of both coats, and the Al2O 3 coated sample exhibits the better anti-corrosion performance. Surface morphology observations revealed the presence of highly homogeneous and adherent films formed on the metal substrate during the sol-gel process. These films act as a barrier to prevent the substrate from corrosion in the aggressive environment. This sol-gel coating is therefore seen as a promising replacement for that of Cr6+ electroplating.",

author = "H. Xu and R. Akid and G. Brumpton and H. Wang and Rodenburg, {J. M.}",

note = "Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003) SEP 03-05, 2003 Oxford, ENGLAND; Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference ; Conference date: 01-07-2004",

year = "2004",

language = "English",

volume = "179",

series = "Institute of Physics Conference Series",

publisher = "CRC Press",

pages = "417--420",

booktitle = "Institute of Physics Conference Series|Inst. Phys. Conf. Ser.",

address = "United States",

url = "http://shura.shu.ac.uk/1084/",

}

Xu, H, Akid, R, Brumpton, G, Wang, H & Rodenburg, JM 2004, Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples. in Institute of Physics Conference Series|Inst. Phys. Conf. Ser.. vol. 179, Institute of Physics Conference Series, vol. 179, CRC Press, pp. 417-420, Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, Oxford, 1/07/04. <http://shura.shu.ac.uk/1084/>

TY - CHAP

T1 - Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples

AU - Xu, H.

AU - Akid, R.

AU - Brumpton, G.

AU - Wang, H.

AU - Rodenburg, J. M.

N1 - Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003) SEP 03-05, 2003 Oxford, ENGLAND

PY - 2004

Y1 - 2004

N2 - Atomic force microscopy (AFM) and scanning electron microscopy (SEM) have been used to study the surface characteristics and corrosion mechanisms of Ni/Cr electrocoats and Al2O3 sol-gel coats before and after accelerated corrosion tests in a 0.5% NaCl solution at 18°G The results of electrochemical tests show that the corrosion resistance of substrates has been much improved by the application of both coats, and the Al2O 3 coated sample exhibits the better anti-corrosion performance. Surface morphology observations revealed the presence of highly homogeneous and adherent films formed on the metal substrate during the sol-gel process. These films act as a barrier to prevent the substrate from corrosion in the aggressive environment. This sol-gel coating is therefore seen as a promising replacement for that of Cr6+ electroplating.

AB - Atomic force microscopy (AFM) and scanning electron microscopy (SEM) have been used to study the surface characteristics and corrosion mechanisms of Ni/Cr electrocoats and Al2O3 sol-gel coats before and after accelerated corrosion tests in a 0.5% NaCl solution at 18°G The results of electrochemical tests show that the corrosion resistance of substrates has been much improved by the application of both coats, and the Al2O 3 coated sample exhibits the better anti-corrosion performance. Surface morphology observations revealed the presence of highly homogeneous and adherent films formed on the metal substrate during the sol-gel process. These films act as a barrier to prevent the substrate from corrosion in the aggressive environment. This sol-gel coating is therefore seen as a promising replacement for that of Cr6+ electroplating.

M3 - Chapter

VL - 179

T3 - Institute of Physics Conference Series

SP - 417

EP - 420

BT - Institute of Physics Conference Series|Inst. Phys. Conf. Ser.

PB - CRC Press

T2 - Electron Microscopy and Analysis 2003 - Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference

Y2 - 1 July 2004

ER -

Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples

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