Abstract
Results of a study on the electrochemical properties of exfoliated single and multilayer graphene flakes are presented. Graphene flakes were deposited on silicon/silicon oxide wafers to enable fast and accurate characterization by optical microscopy and Raman spectroscopy. Conductive silver paint and silver wires were used to fabricate contacts; epoxy resin was employed as a masking coating in order to expose a stable, well-defined area of graphene. Both multilayer and monolayer graphene microelectrodes showed quasi-reversible behavior during voltammetric measurements in potassium ferricyanide. However, the standard heterogeneous charge transfer rate constant, k°, was estimated to be higher for monolayer graphene flakes. © 2011 American Chemical Society.
Original language | English |
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Pages (from-to) | 8809-8815 |
Number of pages | 7 |
Journal | ACS Nano |
Volume | 5 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2011 |
Keywords
- electrochemistry
- electron transfer
- graphene
- Raman spectroscopy