Electromechanical sensing of substrate charge hidden under atomic 2D crystals

  • Nicholas D. Kay
  • , Benjamin J. Robinson
  • , Vladimir I. Fal'Ko
  • , Konstantin S. Novoselov
  • , Oleg V. Kolosov*
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The functionality of graphene and other two-dimensional materials in electronic devices is highly influenced by the film-substrate charge transfer affecting local carrier density. We demonstrate that charges buried under the few layer graphene on/in the insulating substrate can be detected using electromechanical actuation of the conductive atomically thin layers, allowing measurements of areal density of film-substrate transferred charges under few layer graphene and MoS2 suspended films.

    Original languageEnglish
    Pages (from-to)3400-3404
    Number of pages5
    JournalNano Letters
    Volume14
    Issue number6
    DOIs
    Publication statusPublished - 11 Jun 2014

    Keywords

    • contact mode
    • EFM
    • Graphene
    • NEMS
    • surface charges

    Research Beacons, Institutes and Platforms

    • National Graphene Institute

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