Abstract
The functionality of graphene and other two-dimensional materials in electronic devices is highly influenced by the film-substrate charge transfer affecting local carrier density. We demonstrate that charges buried under the few layer graphene on/in the insulating substrate can be detected using electromechanical actuation of the conductive atomically thin layers, allowing measurements of areal density of film-substrate transferred charges under few layer graphene and MoS2 suspended films.
| Original language | English |
|---|---|
| Pages (from-to) | 3400-3404 |
| Number of pages | 5 |
| Journal | Nano Letters |
| Volume | 14 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 11 Jun 2014 |
Keywords
- contact mode
- EFM
- Graphene
- NEMS
- surface charges
Research Beacons, Institutes and Platforms
- National Graphene Institute