Electron delocalization in amorphous carbon by ion implantation

RUA Khan, J D Carey, SRP Silva, B J Jones, R C Barklie

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The electrical properties of amorphous carbon are governed by the high localization of the sp2 ?? states, and conventional methods of altering the sp2 content result in macroscopic graphitization. By using ion beams we have achieved a delocalization of the ?? states by introducing nanoclustering and hence improving the connectivity between existing clusters, as demonstrated by the increase in the conductivity by two orders of magnitude without modification of the band gap. At higher doses, paramagnetic relaxation-time measurements indicate that exchange effects are present. This unveils the possibility of amorphous carbon-based electronics by tailoring the ion-beam conditions, which we demonstrate in the form of a rectifying device.
    Original languageEnglish
    Pages (from-to)1212011-1212014
    Number of pages4
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume63
    Issue number12
    Publication statusPublished - 2001

    Keywords

    • article
    • Carbon
    • conductance
    • device
    • electricity
    • electron
    • implantation
    • ion
    • measurement
    • methodology

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