Abstract
We present a simple model dielectric response function for both bulk and individual carbon nanotubes based on a parameterization of experimental optical data and analytic dispersion relations that account for dimensionality and linewidth broadening. The model is used to calculate electron inelastic mean free paths over a broad energy range of interest to various applications. © 2009 American Institute of Physics.
Original language | English |
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Article number | 263113 |
Journal | Applied Physics Letters |
Volume | 94 |
Issue number | 26 |
DOIs | |
Publication status | Published - 2009 |