Electron inelastic mean free paths for carbon nanotubes from optical data

Ioanna Kyriakou, Dimitris Emfietzoglou, Rafael Garcia-Molina, Isabel Abril, Kostas Kostarelos

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We present a simple model dielectric response function for both bulk and individual carbon nanotubes based on a parameterization of experimental optical data and analytic dispersion relations that account for dimensionality and linewidth broadening. The model is used to calculate electron inelastic mean free paths over a broad energy range of interest to various applications. © 2009 American Institute of Physics.
    Original languageEnglish
    Article number263113
    JournalApplied Physics Letters
    Volume94
    Issue number26
    DOIs
    Publication statusPublished - 2009

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