Electron microscopy of localisation effects in quantum wells of InGaN in GaN

C. J. Humphreys, T. M. Smeeton, M. J. Kappers, J. S. Barnard, D. M. Graham, A. Soltani-Vala, M. J. Godfrey, E. J. Thrush

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Original languageEnglish
    Title of host publicationProc. 10th International Beijing Conference on Instrumental Analysis
    Pages91-93
    Number of pages3
    Publication statusPublished - 2003
    Event10th International Beijing Conference on Instrumental Analysis - Beijing (China)
    Duration: 1 Jan 1824 → …

    Conference

    Conference10th International Beijing Conference on Instrumental Analysis
    CityBeijing (China)
    Period1/01/24 → …

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