Electronic properties of amorphous carbon nitride a-C1-xNx:H films investigated using vibrational and ESR characterisations

M Lacerda; M Lejeune; B J Jones; R C Barklie; R Bouzerar; K Zellama; NMJ Conway; C Godet

doi:10.1016/S0022-3093(01)00990-5

Electronic properties of amorphous carbon nitride a-C1-xNx:H films investigated using vibrational and ESR characterisations

M Lacerda, M Lejeune, B J Jones, R C Barklie, R Bouzerar, K Zellama, NMJ Conway, C Godet

Research output: Contribution to journal › Article › peer-review

Abstract

A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-{xNx}:H films (x ??? 20 at.\%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 ?? 1019-1.6 ?? 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the {ID}/{IG} ratio and a narrowing of the D-peak. ?? 2002 Published by Elsevier Science B.V.

Original language	English
Pages (from-to)	907-911
Number of pages	5
Journal	Journal of non-crystalline solids
Volume	299-302
Issue number	{PART} 2
DOIs	https://doi.org/10.1016/S0022-3093(01)00990-5
Publication status	Published - 2002

Keywords

Amorphous films
Carbon nitride
Decomposition
Film growth
Nanostructured materials
Paramagnetic resonance
Plasma applications
Plasma decomposition
Raman spectroscopy

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10.1016/S0022-3093(01)00990-5

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Cite this

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title = "Electronic properties of amorphous carbon nitride a-C1-xNx:H films investigated using vibrational and ESR characterisations",

abstract = "A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-{xNx}:H films (x ??? 20 at.\%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 ?? 1019-1.6 ?? 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the {ID}/{IG} ratio and a narrowing of the D-peak. ?? 2002 Published by Elsevier Science B.V.",

keywords = "Amorphous films, Carbon nitride, Decomposition, Film growth, Nanostructured materials, Paramagnetic resonance, Plasma applications, Plasma decomposition, Raman spectroscopy",

author = "M Lacerda and M Lejeune and Jones, {B J} and Barklie, {R C} and R Bouzerar and K Zellama and NMJ Conway and C Godet",

year = "2002",

doi = "10.1016/S0022-3093(01)00990-5",

language = "English",

volume = "299-302",

pages = "907--911",

journal = "Journal of non-crystalline solids",

issn = "0022-3093",

publisher = "Elsevier BV",

number = "{PART} 2",

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TY - JOUR

T1 - Electronic properties of amorphous carbon nitride a-C1-xNx:H films investigated using vibrational and ESR characterisations

AU - Lacerda, M

AU - Lejeune, M

AU - Jones, B J

AU - Barklie, R C

AU - Bouzerar, R

AU - Zellama, K

AU - Conway, NMJ

AU - Godet, C

PY - 2002

Y1 - 2002

N2 - A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-{xNx}:H films (x ??? 20 at.\%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 ?? 1019-1.6 ?? 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the {ID}/{IG} ratio and a narrowing of the D-peak. ?? 2002 Published by Elsevier Science B.V.

AB - A combination of electron spin resonance and Raman spectroscopy measurements is applied to fully characterise a-C1-{xNx}:H films (x ??? 20 at.\%), grown by plasma decomposition of C2H2-N2 mixtures. The observed decrease in the spin density (8.5 ?? 1019-1.6 ?? 1019 cm-3) when the N content increases is consistent with the decrease in the disorder of the sp2 nanostructure evidenced by resonant Raman spectroscopy (at 488 and 514.5 nm excitations), which shows an increase in the {ID}/{IG} ratio and a narrowing of the D-peak. ?? 2002 Published by Elsevier Science B.V.

KW - Amorphous films

KW - Carbon nitride

KW - Decomposition

KW - Film growth

KW - Nanostructured materials

KW - Paramagnetic resonance

KW - Plasma applications

KW - Plasma decomposition

KW - Raman spectroscopy

U2 - 10.1016/S0022-3093(01)00990-5

DO - 10.1016/S0022-3093(01)00990-5

M3 - Article

SN - 0022-3093

VL - 299-302

SP - 907

EP - 911

JO - Journal of non-crystalline solids

JF - Journal of non-crystalline solids

IS - {PART} 2

ER -

Electronic properties of amorphous carbon nitride a-C1-xNx:H films investigated using vibrational and ESR characterisations

Abstract

Keywords

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