Skip to main navigation Skip to search Skip to main content

EM inspection of microstructure during hot processing: The journey from first principles to plant

  • A J Peyton
  • , C L Davis
  • , F D Van Den Berg
  • , B M Smith

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

    Original languageEnglish
    Title of host publicationhost publication
    Pages3317-3325
    Number of pages9
    Volume3
    Publication statusPublished - 2014

    Cite this