@inproceedings{d3b2ac293fef490cab3279a722eec812,
title = "Enhanced wafer matching heuristics for 3-D ICs",
keywords = "Delay , Europe , Integrated circuit modeling , Laboratories , Manufacturing , Marketing and sales , Semiconductor device modeling",
author = "Pavlidis, {Vasilis F.} and Hu Xu and {De Micheli}, Giovanni",
year = "2012",
doi = "10.1109/ETS.2012.6233032",
language = "English",
isbn = "9781467306973",
booktitle = "Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012|Proc. - IEEE Eur. Test Symp., ETS",
publisher = "IEEE",
address = "United States",
note = "2012 17th IEEE European Test Symposium, ETS 2012 ; Conference date: 01-07-2012",
}