Epitaxial al on δ-doped GaAs. A reproducible and very thermally stable low resistance non-alloyed ohmic contact to GaAs

M. Missous*

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

A new approach to fabricating very reproducible and extremely stable non alloyed ohmic contacts to n-GaAs is reported. The technique relies on the use of surface δ-doping and epitaxial Al metallisation. The advantages of this new type of ohmic contact are: (i) Very low specific contact resistivity (< 106 Ωcm-2). (ii) Thermal stability up to 550°C. (iii) Abrupt interfaces with GaAs with virtually no chemical reactions or interdiffusion leading to penetration depths of less than 90 A (compared with 2000 A for the Au-Ge contact). (iv) Al metallisation allowing submicron patterns to be achieved. (v) Simplicity of fabrication and reproducibility. This approach open up the way to hybrid configurations in MESETs were the epitaxial Al can be used as both the gate and source and drain metallisations.

Original languageEnglish
Title of host publicationGallium Arsenide and Related Compounds
PublisherIOP Publishing Ltd
Chapter4
Pages187-190
Number of pages4
ISBN (Print)0854984100
Publication statusPublished - 1 Dec 1991
EventProceedings of the 18th International Symposium on Gallium Arsenide and Related Compounds - Seattle, WA, USA
Duration: 9 Sept 199112 Sept 1991

Publication series

NameInstitute of Physics Conference Series
Volume120
ISSN (Print)0951-3248

Conference

ConferenceProceedings of the 18th International Symposium on Gallium Arsenide and Related Compounds
CitySeattle, WA, USA
Period9/09/9112/09/91

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