Abstract
The way in which the Stranski-Krastanow epitaxial islanding transition can be controlled by strain due to elemental segregation within the initially-formed flat 'wetting' layer is examined in detail. Experimentally measured critical 'wetting' layer thicknesses for the InxGa1-xAs/GaAs system (x = 0.25 - 1) are demonstrated to show good agreement with values calculated using a segregation model. The strain energy associated with the segregated surface layer is determined for the complete range of deposited In concentrations using atomistic simulations. The segregation-mediated driving force for the Stranski-Krastanow transition is considered to be important also for all other epitaxial systems exhibiting the transition.
Original language | English |
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Pages (from-to) | 3-10 |
Number of pages | 7 |
Journal | Materials Research Society Symposium Proceedings |
Volume | 696 |
Publication status | Published - 2002 |