Abstract
The problem of determining errors in the fitting of non-linear functions to photoemission spectra is considered. A simple method of determining the standard error on each fitting parameter is outlined, using the widely used Levenberg-Marquardt fitting method. This is discussed with reference to the fitting of Si 2p photoemission data, for Si-containing species adsorbed on the Cu{111} surface. A C/C++ algorithm for modelling multiple spin-orbit split doublet peaks with a Voigt lineshape is presented. © 1998 Elsevier Science B.V. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 97-105 |
| Number of pages | 8 |
| Journal | Journal of Electron Spectroscopy and Related Phenomena |
| Volume | 94 |
| Issue number | 1-2 |
| Publication status | Published - 30 Jun 1998 |
Keywords
- Errors
- Fitting
- Levenberg-Marquardt
- Photoemission
- Silicon