TY - JOUR
T1 - Evaluation of residual stress development at the interface of plasma electrolytically oxidized and cold-worked aluminum
AU - Asquith, David
AU - Yerokhin, Aleksey
AU - James, Neil
AU - Yates, John
AU - Matthews, Allan
PY - 2013/10/1
Y1 - 2013/10/1
N2 - Fatigue failure in hard oxide-coated aluminum is usually driven by rapid short crack propagation from the interface through the substrate; mitigation of this is possible by introducing interfacial compressive stresses. Combining cold work with hard oxide coating can improve their performance under conditions of simultaneous wear, corrosion, and fatigue. Three-dimensional strain fields in an aluminum alloy with combined cold work and PEO coating have been measured and mechanisms for stress redistribution presented. These comprise material consumption, expansive growth of oxide layers, and local annealing.
AB - Fatigue failure in hard oxide-coated aluminum is usually driven by rapid short crack propagation from the interface through the substrate; mitigation of this is possible by introducing interfacial compressive stresses. Combining cold work with hard oxide coating can improve their performance under conditions of simultaneous wear, corrosion, and fatigue. Three-dimensional strain fields in an aluminum alloy with combined cold work and PEO coating have been measured and mechanisms for stress redistribution presented. These comprise material consumption, expansive growth of oxide layers, and local annealing.
KW - Residual stress
KW - Compressive residual stress
KW - Shot peening
KW - Plasma electrolytic oxidation
KW - Plasma electrolytic oxidation coating
UR - http://www.scopus.com/inward/record.url?scp=84883454079&partnerID=8YFLogxK
U2 - 10.1007/s11661-013-1854-0
DO - 10.1007/s11661-013-1854-0
M3 - Article
AN - SCOPUS:84883454079
SN - 1073-5623
VL - 44
SP - 4461
EP - 4465
JO - Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
JF - Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
IS - 10
ER -