Excimer laser ablation and film deposition of Ti:sapphire

PE Dyer, SR Jackson, PH Key, WJ Metheringham, Marc Schmidt

    Research output: Contribution to journalArticle

    Abstract

    ArF laser ablation of Ti:sapphire (Ti:Al2O3) has been investigated as a potential means for micromachining this laser crystal and depositing thin layers for use as active waveguides. Plume spectra recorded for ablation in low pressure oxygen and a preliminary assessment of layers grown by this method are reported.
    Original languageEnglish
    Pages (from-to)849-854
    Number of pages6
    JournalApplied Surface Science
    Volume96-98
    Publication statusPublished - Apr 1996

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