TY - JOUR
T1 - Excitation Strategies for 3-D Electrical Capacitance Tomography Sensors
AU - Shen, Jingjing
AU - Meng, Shuanghe
AU - Yang, Wuqiang
AU - Ye, Mao
PY - 2021/4/22
Y1 - 2021/4/22
N2 - This article presents investigation of 3-D electrical capacitance tomography (ECT) sensors with different excitation strategies, including dual-electrode excitation in the same plane, in adjacent plane, in planes separated by one plane or two planes, and in the adjacent position or opposite position in the same or different planes. The results show that a 3-D ECT sensor with dual-electrode excitation in the opposite position provides higher mean capacitance and lower standard deviation than in the adjacent position. Dual-electrode excitation in different planes can increase the capacitance signal and decrease the dynamic range of capacitance measurements, and thus, decrease random errors and improve the quality of 3-D reconstructed images. A 3-D ECT sensor with dual-electrode excitation in planes separated by one plane and opposite position can provide small measurement uncertainty and high image quality
AB - This article presents investigation of 3-D electrical capacitance tomography (ECT) sensors with different excitation strategies, including dual-electrode excitation in the same plane, in adjacent plane, in planes separated by one plane or two planes, and in the adjacent position or opposite position in the same or different planes. The results show that a 3-D ECT sensor with dual-electrode excitation in the opposite position provides higher mean capacitance and lower standard deviation than in the adjacent position. Dual-electrode excitation in different planes can increase the capacitance signal and decrease the dynamic range of capacitance measurements, and thus, decrease random errors and improve the quality of 3-D reconstructed images. A 3-D ECT sensor with dual-electrode excitation in planes separated by one plane and opposite position can provide small measurement uncertainty and high image quality
U2 - 10.1109/TIM.2021.3075038
DO - 10.1109/TIM.2021.3075038
M3 - Article
SN - 0018-9456
VL - 70
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
M1 - 4504409
ER -