Exciton fine structure splitting in dot-in-a-well structures

A. I. Tartakovskii; R. S. Kolodka; H. Y. Liu; M. A. Migliorato; M. Hopkinson; M. N. Makhonin; D. J. Mowbray; M. S. Skolnick

doi:10.1063/1.2191476

Exciton fine structure splitting in dot-in-a-well structures

A. I. Tartakovskii, R. S. Kolodka, H. Y. Liu, M. A. Migliorato, M. Hopkinson, M. N. Makhonin, D. J. Mowbray, M. S. Skolnick

Research output: Contribution to journal › Article › peer-review

Abstract

A range of dot-in-a-well structures designed for long-wavelength (>1.3 μm) emission is studied in polarization- and time-resolved differential transmission measurements. Quantum beats observed in differential transmission are employed to measure the fine structure splitting (EFS) of the bright exciton states. A strong dependence of EFS on In content in the InGaAs well surrounding the dots is observed. Large magnitudes of EFS up to 87 μeV are found. © 2006 American Institute of Physics.

Original language	English
Article number	131115
Journal	Applied Physics Letters
Volume	88
Issue number	13
DOIs	https://doi.org/10.1063/1.2191476
Publication status	Published - 2006

Access to Document

10.1063/1.2191476

Cite this

@article{99713ed33caf4873a06d5680e5f144f8,

title = "Exciton fine structure splitting in dot-in-a-well structures",

abstract = "A range of dot-in-a-well structures designed for long-wavelength (>1.3 μm) emission is studied in polarization- and time-resolved differential transmission measurements. Quantum beats observed in differential transmission are employed to measure the fine structure splitting (EFS) of the bright exciton states. A strong dependence of EFS on In content in the InGaAs well surrounding the dots is observed. Large magnitudes of EFS up to 87 μeV are found. {\textcopyright} 2006 American Institute of Physics.",

author = "Tartakovskii, {A. I.} and Kolodka, {R. S.} and Liu, {H. Y.} and Migliorato, {M. A.} and M. Hopkinson and Makhonin, {M. N.} and Mowbray, {D. J.} and Skolnick, {M. S.}",

note = "Times Cited: 3",

year = "2006",

doi = "10.1063/1.2191476",

language = "English",

volume = "88",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "13",

}

TY - JOUR

T1 - Exciton fine structure splitting in dot-in-a-well structures

AU - Tartakovskii, A. I.

AU - Kolodka, R. S.

AU - Liu, H. Y.

AU - Migliorato, M. A.

AU - Hopkinson, M.

AU - Makhonin, M. N.

AU - Mowbray, D. J.

AU - Skolnick, M. S.

N1 - Times Cited: 3

PY - 2006

Y1 - 2006

N2 - A range of dot-in-a-well structures designed for long-wavelength (>1.3 μm) emission is studied in polarization- and time-resolved differential transmission measurements. Quantum beats observed in differential transmission are employed to measure the fine structure splitting (EFS) of the bright exciton states. A strong dependence of EFS on In content in the InGaAs well surrounding the dots is observed. Large magnitudes of EFS up to 87 μeV are found. © 2006 American Institute of Physics.

AB - A range of dot-in-a-well structures designed for long-wavelength (>1.3 μm) emission is studied in polarization- and time-resolved differential transmission measurements. Quantum beats observed in differential transmission are employed to measure the fine structure splitting (EFS) of the bright exciton states. A strong dependence of EFS on In content in the InGaAs well surrounding the dots is observed. Large magnitudes of EFS up to 87 μeV are found. © 2006 American Institute of Physics.

U2 - 10.1063/1.2191476

DO - 10.1063/1.2191476

M3 - Article

SN - 0003-6951

VL - 88

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

M1 - 131115

ER -

Exciton fine structure splitting in dot-in-a-well structures

Abstract

Access to Document

Fingerprint

Cite this