Exciton fine structure splitting in dot-in-a-well structures

A. I. Tartakovskii, R. S. Kolodka, H. Y. Liu, M. A. Migliorato, M. Hopkinson, M. N. Makhonin, D. J. Mowbray, M. S. Skolnick

    Research output: Contribution to journalArticlepeer-review


    A range of dot-in-a-well structures designed for long-wavelength (>1.3 μm) emission is studied in polarization- and time-resolved differential transmission measurements. Quantum beats observed in differential transmission are employed to measure the fine structure splitting (EFS) of the bright exciton states. A strong dependence of EFS on In content in the InGaAs well surrounding the dots is observed. Large magnitudes of EFS up to 87 μeV are found. © 2006 American Institute of Physics.
    Original languageEnglish
    Article number131115
    JournalApplied Physics Letters
    Issue number13
    Publication statusPublished - 2006


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