TY - GEN
T1 - Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes
AU - Garcia-Perez, O.
AU - Alimi, Y.
AU - Song, A.
AU - Iniguez-De-La-Torre, I.
AU - Perez, S.
AU - Mateos, J.
AU - Gonzalez, T.
PY - 2015
Y1 - 2015
N2 - In this work, the presence of an anomalous increase of low-frequency noise associated with the initiation of the oscillatory regime in Gunn diodes has been studied and experimentally evidenced. When incipient instabilities begin to appear in the device, its intermittent nature drastically enhances the noise at frequencies well below that of the oscillation. For higher bias voltages, the oscillation becomes purer and the associated low-frequency noise disappears.
AB - In this work, the presence of an anomalous increase of low-frequency noise associated with the initiation of the oscillatory regime in Gunn diodes has been studied and experimentally evidenced. When incipient instabilities begin to appear in the device, its intermittent nature drastically enhances the noise at frequencies well below that of the oscillation. For higher bias voltages, the oscillation becomes purer and the associated low-frequency noise disappears.
UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-84961782602&partnerID=MN8TOARS
U2 - 10.1109/ICNF.2015.7288553
DO - 10.1109/ICNF.2015.7288553
M3 - Conference contribution
BT - 2015 International Conference on Noise and Fluctuations, ICNF 2015
ER -