Experimental verification of low-frequency noise effects at the onset of oscillations in planar Gunn diodes

O. Garcia-Perez, Y. Alimi, A. Song, I. Iniguez-De-La-Torre, S. Perez, J. Mateos, T. Gonzalez

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

In this work, the presence of an anomalous increase of low-frequency noise associated with the initiation of the oscillatory regime in Gunn diodes has been studied and experimentally evidenced. When incipient instabilities begin to appear in the device, its intermittent nature drastically enhances the noise at frequencies well below that of the oscillation. For higher bias voltages, the oscillation becomes purer and the associated low-frequency noise disappears.
Original languageUndefined
Title of host publication2015 International Conference on Noise and Fluctuations, ICNF 2015
DOIs
Publication statusPublished - 2015

Cite this